{"id":4689,"date":"2024-04-03T15:32:14","date_gmt":"2024-04-03T15:32:14","guid":{"rendered":"https:\/\/iap.um6p.ma\/?page_id=4689"},"modified":"2026-04-21T16:39:47","modified_gmt":"2026-04-21T16:39:47","slug":"atomic-force-microscopy","status":"publish","type":"page","link":"https:\/\/physicsschool.um6p.ma\/?page_id=4689","title":{"rendered":"Atomic Force Microscopy"},"content":{"rendered":"

[vc_row][vc_column width=”1\/4″][vc_column_text]<\/p>\n

Research<\/span><\/h2>\n
About<\/u><\/span><\/a><\/h6>\n
Equipment<\/span><\/a><\/h6>\n
About<\/u><\/a><\/span><\/h6>\n
Users Committee<\/u><\/a><\/span><\/h6>\n
Equipment<\/a><\/span><\/h6>\n
Raman Spectroscopy<\/u><\/a><\/span><\/h6>\n
Terahertz Imaging<\/span><\/span><\/a>
\n<\/span><\/h6>\n
Atomic Force Microscopy<\/span><\/a><\/span><\/h6>\n
Synthesis Area<\/span><\/a><\/span><\/h6>\n
Magneto Transport Spectroscopy<\/span><\/a><\/span><\/h6>\n
Femto-laser<\/span><\/h6>\n
Fees and Chemical Information<\/u><\/a><\/span><\/h6>\n
User Access<\/a><\/span><\/h6>\n
Reservation\/Booking<\/a><\/span><\/h6>\n
Softwares\/Consumables<\/span><\/a><\/span><\/h6>\n
Semi-Conductors Physics<\/u><\/span><\/a><\/h6>\n
Terahertz Photonics<\/u><\/span><\/a><\/h6>\n
Nuclear, Particle Physics, and Cosmology<\/u><\/span><\/a><\/h6>\n
Space Science and Technology<\/u><\/span><\/a><\/h6>\n
OCP Track<\/u><\/a><\/span><\/h6>\n
Publications<\/u><\/span><\/a><\/u><\/h6>\n

[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]<\/p>\n

\n
\n

Atomic Force Microscopy<\/h2>\n<\/div>\n<\/div>\n

[\/vc_column_text][vc_separator color=”black”][vc_column_text]Guarantor<\/b><\/p>\n

Ghassane Tiouitchi, Scientist[\/vc_column_text][vc_separator color=”black”][vc_column_text]Instrument status:
\n<\/strong>Operational 01\/04\/2024<\/p>\n

Equipment placement:
\n<\/strong>Riad 8 first floor, Physics low temperature Area[\/vc_column_text][vc_separator color=”black”][vc_column_text]The Nanosurf FlexAFM system is an atomic force microscope that can measure the topography and several other properties of a sample with nanometer resolution. These measurements are performed, displayed, and evaluated using the Nanosurf C3000 control software.<\/p>\n

The Nanosurf FlexAFM combined with the C3000 controller is a fully-fledged research system that can be used to perform stand-alone AFM measurements or be integrated into inverted microscope systems for combined microscopic (fluorescence, phase contrast, brightfield) and AFM data (topography, elasticity, force, etc.).<\/p>\n

\"\"<\/p>\n

The available measurements modes are the following: Static (Contact Mode), Dynamic (Tapping Mode), Kelvin probe force microscopy (KPFM), piezoresponse force microscopy (PFM), magnetic force microscopy (MFM) and STM mode for the atomic level microscopy.\u00a0<\/strong><\/p>\n

    \n
  1. Specifications and features:<\/strong><\/li>\n<\/ol>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
    Scan Head Specifications<\/strong><\/td>\nFlexAFM 100 \u03bcm<\/strong><\/td>\n<\/tr>\n
    Sample size<\/td>\nUnlimited without sample stage;
    \n100 mm on sample stage<\/td>\n<\/tr>\n
    Maximum Petri dish height (fluid level in dish)<\/td>\n9 mm (6 mm)<\/td>\n<\/tr>\n
    Manual approach range<\/td>\n30 mm<\/td>\n<\/tr>\n
    Manual approach range<\/td>\n1.1 mm<\/td>\n<\/tr>\n
    Maximum scan range<\/td>\n100 \u03bcm (1)<\/sup><\/td>\n<\/tr>\n
    Maximum Z-range<\/td>\n10 \u03bcm (2)<\/sup><\/td>\n<\/tr>\n
    Drive Z-resolution<\/td>\n0.152 nm (3)<\/sup><\/td>\n<\/tr>\n
    Drive XY-resolution<\/td>\n1.525 nm (3)<\/sup><\/td>\n<\/tr>\n
    XY-linearity mean error typ. 0.1%<\/td>\ntyp. 0.1%<\/td>\n<\/tr>\n
    XY-flatness at maximum scan range typ. 5 nm typ. 1 nm<\/td>\ntyp. 5 nm<\/td>\n<\/tr>\n
    Z-measurement noise level(RMS, Static Mode in air)<\/td>\ntyp. 0.3 nm<\/td>\n<\/tr>\n
    Z-measurement noise level (RMS, Dynamic Mode in air)<\/td>\ntyp. 0.16 nm<\/td>\n<\/tr>\n
    Scan head dimensions<\/td>\n143 \u00d7 158 \u00d7 53 mm<\/td>\n<\/tr>\n
    Scan head weight<\/td>\n1.25 kg<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

    (1) Manufacturing tolerances are \u00b1 5%
    \n(2) Manufacturing tolerances are \u00b1 10%
    \n(3) Calculated by dividing the maximum range by 16 bits<\/p>\n

      \n
    1. FlexAFM Scan Head Features<\/strong><\/li>\n<\/ol>\n\n\n\n\n\n\n\n\n\n\n\n
      General design<\/td>\nTripod stand-alone, flexure-based electromagnetically actuated XY-scanner, piezo based Z-scanner<\/td>\n<\/tr>\n
      Cantilever alignment<\/td>\nAutomatic alignment for cantilevers with alignment grooves. Manual laser adjustment possible for special cantilevers.<\/td>\n<\/tr>\n
      Laser adjustment<\/td>\nNo laser adjustment required upon immersion of cantilever into liquid because of SureAlign\u2122 laser optics<\/td>\n<\/tr>\n
      Laser adjustment<\/td>\nAvailable<\/td>\n<\/tr>\n
      Laser adjustment<\/td>\nTop and side view in air and liquid<\/td>\n<\/tr>\n
      Visual magnification<\/td>\nTop: 13\u00d7 \/ Side: 10\u00d7<\/td>\n<\/tr>\n
      Sample illumination<\/td>\nWhite axial illumination for top and side view. Transmission illumination with illuminated sample holder.<\/td>\n<\/tr>\n
      Cantilever holder<\/td>\nCleanable and with replaceable cantilever spring<\/td>\n<\/tr>\n
      Operating modes<\/td>\nStatic Force, Dynamic Force, Phase Contrast, MFM \/ EFM, Spreading Resistance, Force Modulation, Lateral Force, Kelvin Probe Force, Scanning Thermal, Multiple Spectroscopy modes, Lithography and Manipulation modes<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n
        \n
      1. AFM Options<\/strong><\/li>\n<\/ol>\n\n\n\n\n\n\n\n\n\n
        Operation modes<\/strong><\/td>\nexplanations<\/strong><\/td>\n<\/tr>\n
        \n

        \u00a0\u00a0\u00a0 Static<\/p>\n

        (Contact Mode)<\/td>\n

        		Static mode, or contact mode, is the original and simplest mode to operate an AFM. In this mode, the probe is in continuous contact with the surface while the probe raster scans the sample. The most common configuration of static mode is to operate it in constant force or deflection feedback mode. In this mode, the cantilever deflection is the feedback parameter.<\/td>\n<\/tr>\n
        \u00a0\u00a0 Dynamic
        \n(Tapping Mode)<\/td>\n        		Dynamic force mode refers to a collection of AFM modes in which the cantilever oscillates at a high frequency at or close to resonance. A specific kind of dynamic mode, referred to as amplitude modulation mode (AM-AFM) is the most common AFM imaging mode. In AM AFM, the amplitude of oscillation is the feedback parameter; other dynamic modes have different parameters for the feedback loop such as frequency (frequency modulation) or phase (phase modulation).<\/td>\n<\/tr>\n
        Kelvin probe
        \nforce microscopy<\/td>\n        		Kelvin probe force microscopy (KPFM) is an extension of the dynamic force mode. Using KPFM, images can be recorded that contain information on the local work function or local contact potential difference between tip and sample.<\/td>\n<\/tr>\n
        \u00a0\u00a0\u00a0 PFM<\/td>\nThis static mode-based method is geared towards the study of ferroelectric or piezoelectric materials, which are materials that respond mechanically to the application of an electric field. This mode measures topography simultaneously with mechanical response of the material when an electric voltage is applied with a conductive AFM tip. A sharp conductive AFM tip is brought into contact with the sample and an AC voltage is applied between the tip and sample. The amplitude gives information on the piezoelectric tensor of the material and the phase provides information on the polarization direction.<\/td>\n<\/tr>\n
        \u00a0\u00a0\u00a0 MFM<\/td>\nMagnetic force microscopy (MFM) is a phase imaging mode that uses atomic force microscope cantilevers with a thin magnetic coating in order to probe the magnetic field between a sample and a magnetized tip. This method is commonly used to image any materials with heterogeneous magnetic properties such as magnetic-based hard disk drives. It can be operated in single, interlaced and dual scan line modes. Any of these modes require optimization of the height above the sample at which the magnetic force microscopy image is collected.<\/td>\n<\/tr>\n
        STM<\/td>\nThe NaioSTM is a scanning tunneling microscope that brings together scan head and controller in a single instrument for even simpler installation, maximized ease of use, and straightforward transportability. The setup is robust against vibrations and can be used to achieve atomic resolution on HOPG in standard classroom situations.<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

        [\/vc_column_text][\/vc_column][\/vc_row]<\/p>\n","protected":false},"excerpt":{"rendered":"

        [vc_row][vc_column width=”1\/4″][vc_column_text] Research About Equipment About Users Committee Equipment Raman Spectroscopy Terahertz Imaging Atomic Force Microscopy Synthesis Area Magneto Transport Spectroscopy Femto-laser Fees and Chemical Information User Access Reservation\/Booking Softwares\/Consumables Semi-Conductors Physics Terahertz Photonics Nuclear, Particle Physics, and Cosmology Space Science and Technology OCP Track Publications [\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text] Atomic Force Microscopy [\/vc_column_text][vc_separator color=”black”][vc_column_text]Guarantor Ghassane Tiouitchi, […]<\/p>\n","protected":false},"author":3,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"cybocfi_hide_featured_image":"","footnotes":""},"class_list":["post-4689","page","type-page","status-publish","hentry"],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/physicsschool.um6p.ma\/index.php?rest_route=\/wp\/v2\/pages\/4689","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/physicsschool.um6p.ma\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/physicsschool.um6p.ma\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/physicsschool.um6p.ma\/index.php?rest_route=\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/physicsschool.um6p.ma\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=4689"}],"version-history":[{"count":36,"href":"https:\/\/physicsschool.um6p.ma\/index.php?rest_route=\/wp\/v2\/pages\/4689\/revisions"}],"predecessor-version":[{"id":7776,"href":"https:\/\/physicsschool.um6p.ma\/index.php?rest_route=\/wp\/v2\/pages\/4689\/revisions\/7776"}],"wp:attachment":[{"href":"https:\/\/physicsschool.um6p.ma\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=4689"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}